Opportunities for single event modeling in emerging commercial technologies

Single event effects - once the domain of high-reliability circuits destined for space applications and highly susceptible DRAMs with alpha-emitting packaging - are now envisioned to be a critical and wide-spread reliability issue for most future-generation commercial integrated circuits. Soft error rate specifications are now commonly found in commercial technology development road-maps. Commercial integrated circuit manufacturing companies, with no interest in space systems, are undertaking single event modeling efforts. This presentation will discuss modeling issues that are emerging as SEE analysis expands from a mission-critical to a commercial reliability-driven environment. (author)