Operando photoelectron emission spectroscopy and microscopy at Elettra soft X-ray beamlines: From model to real functional systems
Creators
- 1. Elettra-Sincrotrone Trieste S.C.p.A, Area Science Park, 34149 Basovizza, Trieste (Italy)
- 2. CNR‐IOM, TASC Laboratory, 34149 Trieste (Italy)
- 3. Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899 (United States)
Description
Highlights: • Environmental cells for in-operando photoelectron spectroscopy and microscopy. • Advantages of using electron and photon transparent graphene membranes. • In-situ grafting of chemo-magnetic patterns and magnetic microscopy. - Abstract: Implementation of in-situ and operando experimental set-ups for bridging the pressure gap in characterization techniques based on monitoring of photoelectron emission has made significant achievements at several beamlines at Elettra synchrotron facility. These set-ups are now operational and have been successfully used to address unsolved issues exploring events occurring at solid–gas, solid–liquid and solid-solid interfaces of functional materials. The sections in the article communicate the research opportunities offered by the current set-ups at APE, BACH, ESCAmicroscopy and Nanospectroscopy beamlines and outline the next steps to overcome the present limits.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.elspec.2019.146902Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2019.146902;
- PII
- S0368204819302270;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Issue
- in press
- Journal Page Range
- vp.
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51051978
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ELECTRON MICROSCOPY; EMISSION SPECTROSCOPY; GRAPHENE; PHOTOELECTRON SPECTROSCOPY; SOFT X RADIATION; SYNCHROTRON RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BREMSSTRAHLUNG; CARBON; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; IONIZING RADIATIONS; MICROSCOPY; NONMETALS; RADIATIONS; SPECTROSCOPY; X RADIATION
Optional Information
- Notes
- © 2019 Elsevier B.V. All rights reserved.