Published August 30, 1974
| Version v1
Report
Open
Neutron-activation analysis of routine mineral-processing samples
Description
Instrumental neutron-activation analysis was applied to a suite of typical mineral-processing samples to establish which elements can be rapidly determined in them by this technique. A total of 35 elements can be determined with precisions (from the counting statistics) ranging from better than 1 per cent to approximately 20 per cent. The elements that can be determined have been tabulated together with the experimental conditions, the precision from the counting statistics, and the estimated number of analyses possible per day. With an automated system, this number can be as high as 150 in the most favourable cases
Availability note (English)
MF available from INIS under the Report Number.Abstract (Afrikaans)
Instrumentele neutronaktiveringsanalise is toegepas op 'n reeks tipiese mineraalverwerkingsmonsters om vas te stel watter elemente vinnig deur middel van hierdie tegniek in hulle bepaal kan word. Altesame 35 elemente kan bepaal word met 'n presisie (vanaf die tellende statistiek) wat wissel van beter as 1 persent tot ongeveer 20 persent. Die elemente wat bepaal kan word, is getabelleer tesame met die eksperimentele toestande, die presisie vanaf die tellende statistiek, en die geraamde getal ontledings wat per dag gedoen kan word. Met 'n geoutomatiseerde stelsel kan hierdie getal in die gunstigste gevalle so hoog as 150 weesFiles
8335091.pdf
Files
(644.0 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:e62140f8bc301e84c0ccd00b18ac9d5f
|
644.0 kB | Preview Download |
Additional details
Publishing Information
- Imprint Pagination
- 13 p.
- Report number
- NIM--1670
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 8335091
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Descriptors DEI
- ACCURACY; ACTIVATION ANALYSIS; AUTOMATION; COUNTING RATES; ELEMENTS; GAMMA SPECTRA; IRRADIATION; LI-DRIFTED GE DETECTORS; MINERALS; STATISTICS
- Descriptors DEC
- CHEMICAL ANALYSIS; GE SEMICONDUCTOR DETECTORS; LI-DRIFTED DETECTORS; MATHEMATICS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTRA