X-ray reflection spectrometers with the Gamosh type vertical focusing

X-ray dynamic Bragg diffraction at biaxially bended crystal, connected with the source, placed on one of bending axes, is studied. Formulae for reflected radiation intensity distribution in a vacuum away from crystal, that are used to calculate diffraction spectral and spatial characteristics of Johan and Johan Gamosh type spectrometers, are derived. Possibility of dynamic diffraction focusing of X-rays by biaxially bended crystal is shown. Spectral resolution of similar focusing spectrometer is calculated