Inelastic x-ray scattering at modest energy resolution
Creators
- 1. Cornell High Energy Synchrotron Source, Cornell Univ., Ithaca, New York14853 (United States)
- 2. Solid State Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee37831-6030 (United States)
Description
We report results from the development of an inelastic scattering spectrometer designed to take advantage of high energy synchrotron radiation available at CHESS. The device allows a large increase of the effective scattering volume in the sample by permitting measurements to be made in an energy range up to 25 KeV. The highest useable energy appears limited by the efficiency of the analyzers under consideration. At 20 KeV a novel 4-bounce, sagittal focusing monochromator passes 10e11 photons/second with Darwin width limited energy resolution. In the scattering plane, the monochromator images the electron beam producing a small scattering source for the analyzing optics. Analyzer systems under study include a cooled mosaic crystal in para-focusing geometry, and an adjustable spherically bent silicon crystal respectively for parallel and point-by-point collection of the energy loss spectrum. This paper discusses the optical configurations presents results from our early measurements and suggests directions for improvements. copyright 1997 American Institute of Physics
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 417
- Journal Issue
- 1
- Journal Page Range
- p. 80-87
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. U.S. national conference on synchrotron radiation instrumentation
- Acronym
- SRI '97
- Dates
- 17-20 Jun 1997
- Place
- Ithaca, NY (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 30057302
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; DIFFERENTIAL CROSS SECTIONS; ENERGY RESOLUTION; KEV RANGE 10-100; MONOCHROMATORS; PERFORMANCE; PHOTON-ELECTRON COLLISIONS; REFLECTIVITY; SYNCHROTRON RADIATION SOURCES; X-RAY SPECTROMETERS
- Descriptors DEC
- COLLISIONS; CROSS SECTIONS; ELECTRON COLLISIONS; ENERGY RANGE; KEV RANGE; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHOTON COLLISIONS; PHYSICAL PROPERTIES; RADIATION SOURCES; RESOLUTION; SPECTROMETERS; SURFACE PROPERTIES
Optional Information
- Secondary number(s)
- CONF-9706157--