Published May 21, 2011
| Version v1
Journal article
Characterization and simulation of different SiPM structures produced at FBK
Creators
- 1. Fondazione Bruno Kessler (FBK-IRST), Via Sommarive 18, I-38123 Trento (Italy)
- 2. Department of Information Engineering and Computer Science, University of Trento, Via Sommarive 14, I-38123 Povo di Trento (Italy)
- 3. Department of Physics, University of Pisa, Largo Bruno Pontecorvo 3, I-56127 Pisa (Italy)
Description
The silicon photomultiplier (SiPM) is one of the most interesting solid-state detectors for very low-level light detection featuring extremely fast timing response. In FBK we manufactured SiPMs with different micro-cell proprieties such as: size, layout and epi-layer thickness. We characterized both statically and dynamically all devices to understand the impact of each parameter on the signal shape and charge. In this paper we report on the impact of the metal layer layout on the signal shape and gain. We will show both experimental results as well as SPICE simulations.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2009.10.030Additional details
Identifiers
- DOI
- 10.1016/j.nima.2009.10.030;
- PII
- S0168-9002(09)01935-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 617
- Journal Issue
- 1-3
- Journal Page Range
- p. 417-419
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 11. Pisa meeting on advanced detectors
- Dates
- 24-30 May 2009
- Place
- La Biodola, Elba (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42009434
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EQUIPMENT; GAIN; LAYERS; PHOTOMULTIPLIERS; RADIATION DETECTION; SHAPE; SIGNALS; SILICON; SIMULATION; THICKNESS
- Descriptors DEC
- AMPLIFICATION; DETECTION; DIMENSIONS; ELEMENTS; PHOTOTUBES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.