Published February 15, 2009 | Version v1
Journal article

Photoluminescence and secondary ion mass spectroscopy characterization of GaAs-AlGaAs quantum wells grown on GaAs (1 0 0) substrates with different surface treatments

  • 1. Physics Department, CINVESTAV-IPN, Av. IPN 2508, Zacatenco, 07360 Mexico, D.F. (Mexico)
  • 2. Electrical Engineering Department, Solid State Section, CINVESTAV-IPN, Av. IPN 2508, Zacatenco, 07360 Mexico, D.F. (Mexico)

Description

GaAs (1 0 0) substrates prepared in a quartz chamber under a H2/As4 flux, and then exposed to air were used for the subsequent growth of GaAs-AlGaAs single quantum wells by molecular beam epitaxy. The substrates prepared by this method showed atomically flat surfaces corroborated by atomic force microscopy analysis. Quantum wells grown directly on these substrates without a GaAs buffer layer exhibited narrow and intense photoluminescence peaks, an indication of a high quality material. The secondary ion mass spectroscopy analysis showed oxygen and carbon traces on the first AlGaAs barrier layer grown after air exposure with no effects on the quantum wells optical emissions. From the results we conclude that the prepared GaAs surfaces are useful for the epitaxial growth of high quality quantum structures.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2008.09.002

Additional details

Identifiers

DOI
10.1016/j.apsusc.2008.09.002;
PII
S0169-4332(08)01972-7;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
255
Journal Issue
9
Journal Page Range
p. 4742-4746
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.