Published June 2014 | Version v1
Journal article

Investigating Rhodanine film formation on roughened Cu surfaces with electrochemical impedance spectroscopy and surface-enhanced Raman scattering spectroscopy

  • 1. Department of Chemistry, University of Illinois, Urbana, IL 61801 (United States)
  • 2. Department of Chemistry, Faculty of Science and Letters, University of Cukurova, Adana 01330 (Turkey)

Description

Highlights: • Time dependent film formation was monitored by Impedance and Raman Spectroscopy. • Two loops in the Nyquist plot are found on rough surfaces and are related to film growth. • Raman spectra intensity decreases with time, an effect attributed to film formation. - Abstract: The inhibitory effect of Rhodanine (RD) on copper in acidic media has been investigated by electrochemical impedance spectroscopy (EIS) and surface-enhance Raman scattering (SERS) spectroscopy. Roughened copper was used for EIS experiments to better compare with SERS results. The EIS results show two loops in the Nyquist plot, one of which is associated with protective film growth on the rough surface after 1 h. The SERS spectra showed a marked decrease in intensity after 1 h, which is attributed to formation of thick films opaque to the laser. The film thickness after 2 h was determined to be ∼200 nm from atomic force microscopy (AFM)

Availability note (English)

Available from http://dx.doi.org/10.1016/j.corsci.2014.01.038

Additional details

Identifiers

DOI
10.1016/j.corsci.2014.01.038;
PII
S0010-938X(14)00053-5;

Publishing Information

Journal Title
Corrosion Science
Journal Volume
83
Journal Page Range
p. 59-66
ISSN
0010-938X
CODEN
CRRSAA

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46027995
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ATOMIC FORCE MICROSCOPY; COMPARATIVE EVALUATIONS; COPPER; CORROSION; FILMS; RAMAN EFFECT; RAMAN SPECTRA; RAMAN SPECTROSCOPY; SURFACES; TIME DEPENDENCE
Descriptors DEC
CHEMICAL REACTIONS; ELEMENTS; EVALUATION; LASER SPECTROSCOPY; METALS; MICROSCOPY; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.