Anti-contamination device for cryogenic soft X-ray diffraction microscopy
Creators
- 1. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11794-3800 (United States)
- 2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- 3. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
- 4. Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208 (United States)
Description
Cryogenic microscopy allows one to view frozen hydrated biological and soft matter specimens with good structural preservation and a high degree of stability against radiation damage. We describe a liquid nitrogen-cooled anti-contamination device for cryogenic X-ray diffraction microscopy. The anti-contaminator greatly reduces the buildup of ice layers on the specimen due to condensation of residual water vapor in the experimental vacuum chamber. We show by coherent X-ray diffraction measurements that this leads to fivefold reduction of background scattering, which is important for far-field X-ray diffraction microscopy of biological specimens. - Highlights: → Anti-contamination device for cryogenic X-ray diffraction microscope. → Reduce background scattering by five folds. → Enable three-dimensional data acquisition from biological samples at cryogenic temperature.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2011.02.085Additional details
Identifiers
- DOI
- 10.1016/j.nima.2011.02.085;
- PII
- S0168-9002(11)00485-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 638
- Journal Issue
- 1
- Journal Page Range
- p. 171-175
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42096938
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DATA ACQUISITION; EQUIPMENT; ICE; LAYERS; LIQUIDS; MICROSCOPES; MICROSCOPY; NITROGEN; PHYSICAL RADIATION EFFECTS; SOFT X RADIATION; STABILITY; TEMPERATURE RANGE 0065-0273 K; THREE-DIMENSIONAL CALCULATIONS; WATER VAPOR; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FLUIDS; GASES; IONIZING RADIATIONS; NONMETALS; RADIATION EFFECTS; RADIATIONS; SCATTERING; TEMPERATURE RANGE; VAPORS; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.