Published May 11, 2011 | Version v1
Journal article

Anti-contamination device for cryogenic soft X-ray diffraction microscopy

  • 1. Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11794-3800 (United States)
  • 2. Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
  • 3. Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439 (United States)
  • 4. Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208 (United States)

Description

Cryogenic microscopy allows one to view frozen hydrated biological and soft matter specimens with good structural preservation and a high degree of stability against radiation damage. We describe a liquid nitrogen-cooled anti-contamination device for cryogenic X-ray diffraction microscopy. The anti-contaminator greatly reduces the buildup of ice layers on the specimen due to condensation of residual water vapor in the experimental vacuum chamber. We show by coherent X-ray diffraction measurements that this leads to fivefold reduction of background scattering, which is important for far-field X-ray diffraction microscopy of biological specimens. - Highlights: → Anti-contamination device for cryogenic X-ray diffraction microscope. → Reduce background scattering by five folds. → Enable three-dimensional data acquisition from biological samples at cryogenic temperature.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2011.02.085

Additional details

Identifiers

DOI
10.1016/j.nima.2011.02.085;
PII
S0168-9002(11)00485-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
638
Journal Issue
1
Journal Page Range
p. 171-175
ISSN
0168-9002
CODEN
NIMAER

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.