Porosity evaluation of aluminium oxide thin films influenced by variation of voltage and current intensity applied during the process of plasma ectylurea oxidation
Creators
- Tavares, M.M.1
- Vitoriano, J.O.1
- Alves Junior, C.1
- Silva, H.F.M.2
- Costa, J.A.P. da3
- Associacao Brasileira de Ceramica (ABCERAM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Metalurgia, Materiais e Mineracao (ABM), Sao Paulo, SP (Brazil)
- Associacao Brasileira de Polimeros (ABPol), Sao Carlos, SP (Brazil)
- 1. Universidade Federal Rural do Semi-Arido (UFERSA), RN (Brazil)
- 2. Universidade Federal do Rio Grande do Norte (UFRN), RN (Brazil)
- 3. Universidade Estadual do Rio Grande do Norte (UFRN), RN (Brazil)
Description
Porosity on aluminium surfaces were controlled by pulsed plasma electrolytic oxidation. For this, it was used a variable pulsed voltage source up to 1500V and 2A. The samples were polarized anodically and placed in electrolyte sodium silicate. A voltage pulse with 70μs of width and a dependent height of the applied current. Pulse and electrolyte concentration were set and varying oxidation time and current intensity. The samples were characterized by diffraction of X-ray (XRD) and scanning electron microscopy (SEM). It was found that it is possible to control the size and distribution of pores varying current and oxidation time. In general these variables are proportional, except only for shortest current and longest oxidation time, which caused smaller pore size and higher porosity. These results are discussed in light of the dynamic oxidation and nucleation sites. (author)
Files
49083875.pdf
Files
(647.1 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:c1bb80abfc26ca27bfa3cea49a2d7fd0
|
647.1 kB | Preview Download |
Additional details
Additional titles
- Original title (Portuguese)
- Avaliacao da porosidade de filmes finos de oxido de aluminio influenciada pela variacao da tensao e da intensidade da corrente aplicados durante o processo de oxidacao por plasma eletrolitico
Publishing Information
- Imprint Pagination
- 12 p.
- Report number
- INIS-BR--21157
Conference
- Title
- Brazilian congress of engineering and materials science
- Original Conference Title
- 22. CBECIMAT: congresso brasileiro de engenharia e ciencia dos materiais
- Acronym
- 22. CBECIMAT
- Dates
- 6-10 Nov 2016
- Place
- Natal, RN (Brazil)
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 49083875
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; ELECTRIC POTENTIAL; ELECTROLYTES; OXIDATION; PORE STRUCTURE; POROSITY; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; FILMS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; SCATTERING