Published January 31, 2005 | Version v1
Journal article

Correlation of hydrogen content with the microstructure of a-C:H films

  • 1. Institute of Physics, Sachivalaya Marg, Bhubaneswar 751 005 (India)
  • 2. Solid State Physics Laboratory, Delhi 110 057 (India)
  • 3. Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208 016 (India)

Description

This paper shows the correlation of hydrogen content with the microstructure of a-C:H films. Samples having hydrogen content ranging from ∼3 to 40 at% and varying microstructures have been prepared using the DC-glow discharge of acetylene (C2H2). Infrared absorption spectroscopy was employed primarily for extracting the bonding information, elastic recoil detection analysis was used to measure the total hydrogen concentration and mass spectroscopic thermal effusion was used for studying the thermal stability of the films. Ion-beam-induced release of hydrogen during elastic recoil detection analysis suggests that the kinetics of this release process is related to the total hydrogen content and microstructure of the samples. Significant differences in the mass spectroscopic thermal effusion spectra obtained from soft as well as hard films also reveal that effusion of various species is dependent on the film microstructure, which in turn is governed by the film growth parameters

Additional details

Identifiers

DOI
10.1016/j.physb.2004.10.024;
PII
S0921-4526(04)01033-6;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
355
Journal Issue
1-4
Journal Page Range
p. 72-77
ISSN
0921-4526
CODEN
PHYBE3

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.