Published August 2005
| Version v1
Journal article
Identification of thin plates seen in R5(Si xGe1-x)4 alloys, where R is Gd, Tb, Dy, and Er
- 1. Ames Laboratory, Iowa State University, Ames IA, 50011-3020 (United States) and Department of Materials Science and Engineering, Iowa State University, Ames IA, 50011-3020 (United States)
- 2. Department of Materials Science and Engineering, Iowa State University, Ames IA, 50011-3020 (United States)
- 3. Ames Laboratory, Iowa State University, Ames IA, 50011-3020 (United States)
Description
R5(Si xGe1-x)4 alloys, where R is Tb, Dy, and Er, have been examined. Their microstructures consisted of large grains with thin plates of a second phase. Energy dispersive spectrometry of the plates revealed a rare earth rich composition. It is proposed that the plates are R5(Si xGe1-x)3 compounds, similar to results seen in Gd5(Si xGe1-x)4
Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2005.03.052;
- PII
- S1359-6462(05)00224-1;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 53
- Journal Issue
- 3
- Journal Page Range
- p. 373-377
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38057353
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALLOYS; MICROSTRUCTURE; PLATES; RARE EARTHS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.