Published December 5, 2005 | Version v1
Journal article

Dislocation engineering for Si-based light emitting diodes

  • 1. Advanced Technology Institute, School of Electronics and Physical Sciences, University of Surrey, Guildford, Surrey GU2 7XH (United Kingdom)
  • 2. School of Engineering, University of Surrey, Guildford, Surrey GU2 7XH (United Kingdom)

Description

In this paper, a general overview of the technologies surrounding light emission in silicon-based systems is presented with an indication as to the applications for which they may be used. Special attention is given to the use of dislocation engineering, where, through the use of additional dopants, not only can 1150-nm band edge emission be achieved but tuning of the wavelength to accommodate telecommunications applications is also possible. Details of the impact of implantation energy and dose are demonstrated together with post implant anneal studies to optimise the process for light generation. Finally, dislocation engineering is applied to silicon on insulator (SOI), the most common optical platform

Additional details

Identifiers

DOI
10.1016/j.mseb.2005.08.050;
PII
S0921-5107(05)00478-2;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
124-125
Journal Page Range
p. 86-92
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
Materials science and device issues for future Si-based technologies
Acronym
E-MRS 2005, Symposium D
Dates
31 May - 3 Jun 2005
Place
Strasbourg (France)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37120613
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DISLOCATIONS; DOPED MATERIALS; EMISSION; ENGINEERING; ION IMPLANTATION; LIGHT EMITTING DIODES; SILICON; VISIBLE RADIATION; WAVELENGTHS
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELEMENTS; LINE DEFECTS; MATERIALS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.