Published December 5, 2005
| Version v1
Journal article
Dislocation engineering for Si-based light emitting diodes
- 1. Advanced Technology Institute, School of Electronics and Physical Sciences, University of Surrey, Guildford, Surrey GU2 7XH (United Kingdom)
- 2. School of Engineering, University of Surrey, Guildford, Surrey GU2 7XH (United Kingdom)
Description
In this paper, a general overview of the technologies surrounding light emission in silicon-based systems is presented with an indication as to the applications for which they may be used. Special attention is given to the use of dislocation engineering, where, through the use of additional dopants, not only can 1150-nm band edge emission be achieved but tuning of the wavelength to accommodate telecommunications applications is also possible. Details of the impact of implantation energy and dose are demonstrated together with post implant anneal studies to optimise the process for light generation. Finally, dislocation engineering is applied to silicon on insulator (SOI), the most common optical platform
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2005.08.050;
- PII
- S0921-5107(05)00478-2;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 124-125
- Journal Page Range
- p. 86-92
- ISSN
- 0921-5107
- CODEN
- MSBTEK
Conference
- Title
- Materials science and device issues for future Si-based technologies
- Acronym
- E-MRS 2005, Symposium D
- Dates
- 31 May - 3 Jun 2005
- Place
- Strasbourg (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37120613
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DISLOCATIONS; DOPED MATERIALS; EMISSION; ENGINEERING; ION IMPLANTATION; LIGHT EMITTING DIODES; SILICON; VISIBLE RADIATION; WAVELENGTHS
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTROMAGNETIC RADIATION; ELEMENTS; LINE DEFECTS; MATERIALS; RADIATIONS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.