Published November 1, 2006
| Version v1
Journal article
The quantum efficiency of photo-charge generation in a-Se avalanche photodetectors
Creators
- 1. Imaging Research, Sunnybrook Health Sciences Centre (Canada)
- 2. NHK Science and Technical Research Laboratories (Japan)
- 3. Hamamatsu Photonics K.K. (Japan)
- 4. Department of Radiology, State University of New York at Stony Brook (United States)
Description
The quantum efficiency of photo-charge generation and avalanche multiplication in amorphous selenium (a-Se) photodetectors were measured over considerable ranges of photoexcitation wavelengths (420-600 nm) and electric fields (10-112.5 V/μm) for several different a-Se target thicknesses (8-35 μm). An avalanche multiplication factor of 1000 is shown for a 35 μm thick a-Se layer at an electric field of 98 V/μm. The experimental results on quantum efficiency can be explained by the Onsager theory of electron-hole pair dissociation in conjunction with an electric field-induced delocalization of states
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2006.05.116;
- PII
- S0168-9002(06)00884-9;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 567
- Journal Issue
- 1
- Journal Page Range
- p. 93-95
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 4. international conference on new developments in photodetection
- Acronym
- BEAUNE 2005
- Dates
- 19-24 Jun 2005
- Place
- Beaune (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38035316
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DISSOCIATION; ELECTRIC FIELDS; LAYERS; PHOTODETECTORS; QUANTUM EFFICIENCY; SELENIUM; THICKNESS; TOWNSEND DISCHARGE; WAVELENGTHS
- Descriptors DEC
- DIMENSIONS; EFFICIENCY; ELECTRIC DISCHARGES; ELEMENTS; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.