Published October 1990 | Version v1
Journal article Metadata-only

Application of energy dispersive X-ray fluorescence for the determination of rare earths

Creators

  • 1. Ecole Europeenne des Hautes Etudes des Industries Chimiques, 67 - Strasbourg (France)
  • 2. Siemens A.G., Karlsruhe (Germany, F.R.)

Description

Energy dispersive X-ray fluorescence (EDXRF) is applied to rare earth element determination. The multi-element capability and lower detection limits offered by this instrument enable the simultaneous determination of rare earth elements in micro-samples at very different concentrations (few ppb to some hundred ppm). Problems of multi-element determination are studied in various compositions and with different interfering L-lines. Precision and reproducibility are presented for several rare earth samples

Abstract (French)

La fluorescence X a dispersion d'energie (EDXRF) est appliquee a la determination des terres rares. La propriete multielementaire, d'une part, et les limites de detection - tres faibles - atteintes par l'appareil, d'autre part, permettent la determination simultanee des terres rares dans des micro-echantillons a des concentrations allant de quelques ppb a quelques centaines de ppm. Les problemes lies a la determination multielementaire sont etudies en faisant varier la composition de la solution a analyser et egalement en fonction du nombre de raies L interferantes. La precision et la reproductibilite de cette methode sont donnees dans le cas de plusieurs echantillons multielementaires de terres rares

Additional details

Additional titles

Original title (French)
Determination des terres rares a l'etat de traces et limites de la fluorescence X a dispersion d'energie

Publishing Information

Journal Title
Analusis
Journal Volume
18
Journal Issue
8
Series
Analusis.
Journal Page Range
497-501
ISSN
0365-4877
CODEN
ANLSC

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
22036619
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Descriptors DEI
ACCURACY; MULTI-ELEMENT ANALYSIS; RARE EARTHS; RELIABILITY; SENSITIVITY; TRACE AMOUNTS; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; ELEMENTS; METALS; NONDESTRUCTIVE ANALYSIS; X-RAY EMISSION ANALYSIS