Published June 1984 | Version v1
Journal article Metadata-only

Radiation testing results on electronics

Creators

  • 1. Wyle Laboratories P.O. Box 1008 Huntsville, AL 35807

Description

no abstract available

Additional details

Publishing Information

Journal Title
Trans. Am. Nucl. Soc.
Journal Volume
46
Series
Trans. Am. Nucl. Soc.
Journal Page Range
373-375
ISSN
0003-018X

Conference

Title
Annual meeting of the American Nuclear Society.
Dates
3-8 Jun 1984.
Place
New Orleans, LA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16031569
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
DESTRUCTIVE TESTING; DOSE RATES; ELECTRONIC EQUIPMENT; GAMMA RADIATION; INTEGRATED CIRCUITS; MOS TRANSISTORS; RADIATION EFFECTS; SYSTEM FAILURE ANALYSIS
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; EQUIPMENT; IONIZING RADIATIONS; MATERIALS TESTING; RADIATIONS; SEMICONDUCTOR DEVICES; SYSTEMS ANALYSIS; TESTING; TRANSISTORS

Optional Information

Notes
Published in summary form only.
Secondary number(s)
CONF-840614--.