Published January 1, 2017
| Version v1
Journal article
The Investigation of Ion Implantation as a Technique for Manufacturing GaAs Magneto-Sensitive Detectors
Creators
- 1. NIIPP, JSC, Tomsk (Russian Federation)
- 2. TUSUR, Tomsk (Russian Federation)
Description
This paper studies thin active layers of n - n i and n +- n - n i -types produced by means of silicon ion implantation into a semi-insulating GaAs substrate. The results of these structures' physical parameters investigation are presented. Based on the structures the Hall-effect sensors are designed that have the linearity of Hall voltage dependency on magnetic density UH(B) of at least 1% in the range of up to B<1.2 T. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/168/1/012026Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 168
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1757-899X
Conference
- Title
- 12. international conference radiation-thermal effects and processes in inorganic materials
- Dates
- 4-12 Sep 2016
- Place
- Tomsk (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49078029
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DENSITY; DESIGN; GALLIUM ARSENIDES; HALL EFFECT; ION IMPLANTATION; LAYERS; MAGNETIC FIELDS; SENSORS; SILICON; SILICON IONS; SUBSTRATES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; CHARGED PARTICLES; ELEMENTS; GALLIUM COMPOUNDS; IONS; PHYSICAL PROPERTIES; PNICTIDES; SEMIMETALS