Published January 1, 2017 | Version v1
Journal article

The Investigation of Ion Implantation as a Technique for Manufacturing GaAs Magneto-Sensitive Detectors

  • 1. NIIPP, JSC, Tomsk (Russian Federation)
  • 2. TUSUR, Tomsk (Russian Federation)

Description

This paper studies thin active layers of n - n i and n +- n - n i -types produced by means of silicon ion implantation into a semi-insulating GaAs substrate. The results of these structures' physical parameters investigation are presented. Based on the structures the Hall-effect sensors are designed that have the linearity of Hall voltage dependency on magnetic density UH(B) of at least 1% in the range of up to B<1.2 T. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/168/1/012026

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
168
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1757-899X

Conference

Title
12. international conference radiation-thermal effects and processes in inorganic materials
Dates
4-12 Sep 2016
Place
Tomsk (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49078029
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DENSITY; DESIGN; GALLIUM ARSENIDES; HALL EFFECT; ION IMPLANTATION; LAYERS; MAGNETIC FIELDS; SENSORS; SILICON; SILICON IONS; SUBSTRATES
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CHARGED PARTICLES; ELEMENTS; GALLIUM COMPOUNDS; IONS; PHYSICAL PROPERTIES; PNICTIDES; SEMIMETALS