Published May 15, 1985 | Version v1
Journal article

Current research using the ANL High Voltage Electron Microscope Tandem Accelerator facility

  • 1. Argonne National Lab., IL (USA). Materials Science and Technology Div.

Description

Recent work at the Argonne National Laboratory (ANL) HVEM - Tandem Accelerator user facility is summarized: direct observation of cluster defects formed by in-situ ion irradiation at low temperature using the ion-beam interface has led to important fundamental results on defect production processes. Results on solute segregation at devated temperatures induced by electron and ion irradiation are reported. Other published work is briefly summarized and/or referenced. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Instrum. Methods Phys. Res., Sect. B
Journal Volume
10/11
Journal Issue
pt.2
Series
CODEN: NIMBE.;Nucl. Instrum. Methods Phys. Res., Sect. B.
Journal Page Range
687-692
ISSN
0168-583X

Conference

Title
8. international conference on the application of accelerators in research and industry.
Dates
12-14 Nov 1984.
Place
Denton, TX (USA).

Optional Information

Notes
Also published as CONF-841117--46.