Published October 6, 2014
| Version v1
Journal article
Turn on of new electronic paths in Fe-SiO2 granular thin film
Creators
- 1. Physics Institute–IF-UFRGS, C.P. 15051, 91501–970, Porto Alegre, Rio Grande do Sul (Brazil)
- 2. Geosciences Institute–IG-UFRGS, C.P. 15001, 91501–970, Porto Alegre, Rio Grande do Sul (Brazil)
- 3. Materials Metrology Division, INMETRO, 25250-020 Duque de Caxias, Rio de Janeiro (Brazil)
Description
The electrical properties of Fe-SiO2 have been studied in the low-field regime (eΔV ≪ kBT), varying the injected current and the bias potential. Superparamagnetism and a resistance drop of 4400 Ω (for a voltage variation of 15 V) were observed at room temperature. This resistance drop increased at lower temperatures. The electrical properties were described with the “Mott variable range hopping” model explaining the behavior of the electrical resistance and the electronic localization length as due to the activation of new electronic paths between more distant grains. This non-ohmic resistance at room temperature can be important for properties dependent of electrical current (magnetoresistance, Hall effect, and magnetoimpedance).
Additional details
Identifiers
- DOI
- 10.1063/1.4898094;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 105
- Journal Issue
- 14
- Journal Page Range
- p. 143112-143112.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46057473
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRICAL PROPERTIES; HALL EFFECT; IRON; MAGNETORESISTANCE; SILICON OXIDES; SUPERPARAMAGNETISM; TEMPERATURE RANGE 0273-0400 K; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MAGNETISM; METALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SILICON COMPOUNDS; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC