Published December 1, 2019 | Version v1
Journal article

Research on Failure Modes and Impact Analysis of Key Electronic Components

  • 1. Xinjiang Institute of State Grid Electric Power Research, Wulumuqi, 830000 (China)
  • 2. Yantai Dongfang Wisdom Electric Co., Ltd, Yantai 264003, Shandong (China)

Description

Analyze the failure mode of electronic components, find the type of stress that causes the failure of the energy meter, trace the key components that cause the fault, and complete the failure mode and impact analysis of key electronic components through failure detection means and failure analysis experiments. In order to develop a reliable product, it is necessary to understand the potential failure mechanism of the product. Modeling to describe the relevant failure modes can promote the development of product design principles. The research results of failure mechanism are not only conducive to improving the reliability manufacturing level of domestic electric energy meter, but also can save the maintenance and transformation cost of electric energy meter, and have very important practical significance for the construction of smart grid. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/677/5/052062

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
677
Journal Issue
5
Journal Page Range
[7 p.]
ISSN
1757-899X

Conference

Title
4. International Conference on Insulating Materials, Material Application and Electrical Engineering
Dates
12-13 Oct 2019
Place
Melbourne (Australia)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
54077785
Subject category
S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COMPUTERIZED SIMULATION; DESIGN; MANUFACTURING; METERS; SMART GRIDS
Descriptors DEC
ENERGY SYSTEMS; MEASURING INSTRUMENTS; POWER SYSTEMS; SIMULATION