Role of electron dissociative attachment and impact dissociation of HCl in XeCl lasers

A computer model of e-beam-pumped XeCl laser mixtures has been developed which uses a time-dependent Boltzman solution for the secondary electron distribution. The model and data indicate that electron dissociative attachment by itself cannot adequately explain the increase in the electron density toward the end of the pulse. The authors believe an additional HCl lost channel must exist. The model results are compared to the electron density and halogen depletion measurements. The results are used to help understand the relative importance of electron dissociative attachment and impact dissociation of HCl with regard to the halogen burnup issue