Fabrication of GaN-based nanorod light emitting diodes using self-assemble nickel nano-mask and inductively coupled plasma reactive ion etching
Creators
- 1. Institute of Electro-Optical Engineering, National Chiao Tung University, Hsinchu, 300, Taiwan (China)
- 2. Global Union Technology Corporation, Hsinchu, 300, Taiwan (China)
- 3. Department of Material Engineering, National Chung Hsing University, Taichung, 400, Taiwan (China)
Description
We report a novel method to fabricate GaN-based nanorod light emitting diodes (LEDs) with controllable dimension and density using self-assemble nickel (Ni) and Ni/Si3N4 nano-masks and inductively coupled plasma reactive ion etching (ICP-RIE). Under the fixed Cl2/Ar flow rate of 50/20 sccm, ICP/Bias power of 400/100 W and chamber pressure of 0.67 Pa, the GaN-based nanorod LEDs were fabricated with density of 2.2 x 109 to 3 x 1010 cm-2 and dimension of 150-60 nm by self assemble Ni nano-masks with various size. The size of Ni/Si3N4 nano-mask was control by the thickness Ni film ranging 150-50 A.a and rapid thermal annealing condition. The technique offers a controllable method of fabrication of GaN-based nanorod LEDs and should be applicable for fabrication of the others III-V nanoscale photonic and electronic devices
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2004.07.004;
- PII
- S0921-5107(04)00280-6;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 113
- Journal Issue
- 2
- Journal Page Range
- p. 125-129
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36047473
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CHLORINE; DENSITY; ELECTRONIC EQUIPMENT; ETCHING; FABRICATION; FILMS; FLOW RATE; GALLIUM NITRIDES; IONS; LIGHT EMITTING DIODES; NANOSTRUCTURES; NICKEL; PLASMA; POWER; SILICON NITRIDES
- Descriptors DEC
- CHARGED PARTICLES; ELEMENTS; EQUIPMENT; GALLIUM COMPOUNDS; HALOGENS; HEAT TREATMENTS; METALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; PHYSICAL PROPERTIES; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SILICON COMPOUNDS; SURFACE FINISHING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.