X-ray emission from highly stripped 32S ions channeled along <100> axis in Si

We have started the investigations of projectile X-ray yields for fully stripped 32S ions incident along the <100> direction in a thin (0.2μm) Si single crystal. Different charge states of 32S ions like 13+, 14+, 15+, 16+ were obtained by passing 32S8+-10+ beam, from the TIFR-BARC 14UD pelletron accelerator, through a 8-10μg/cm2 carbon foil post-stripper. The charge state of the emerging ions was selected with the help of a 30deg beam switching magnet. A thin gold foil was placed downstream and the elastically scattered 32S ions from this gold foil were detected and used for the normalization. Both the target and projectile X-ray were detected by a Si(Li) detector kept at 20deg to the beam direction. It is observed K X-ray emission shows weaker channeling. This indicates that the impact parameters involved in the process is large (by a factor of ≅ √2) as compared to that in the target K X-ray emission. (author). 2 figs