Published August 2007
| Version v1
Journal article
X-Ray fluorescence analysis of vanadium catalysts of sulfuric acid production
- 1. RAN, Inst. Ehlementoorganicheskikh Soedinenij im. A.N. Nesmeyanova, Moscow (Russian Federation)
Description
A method of X-ray fluorescence analysis is developed for quantitative determination of vanadium, potassium, sulfur, silicon, cesium, iron, and calcium in samples of sulfuric acid vanadium catalysts, both fresh and spent ones, inclusive of their surface films and bulk material. It is demonstrated that the above elements can be quantitatively determined with an external calibration standard. The correctness of the procedure has been verified by the added-found technique
Abstract (Russian)
Разработана методика рентгенофлуоресцентного анализа для количественного определения ванадия, калия, серы, кремния, цезия, железа, кальция в пробах из поверхностной пленки гранул и основной массы свежих и отработанных ванадиевых сернокислотных катализаторов. Показано, что количественное определение указанных выше элементов в катализаторе можно проводить с использованием внешнего стандарта. Правильность методики подтверждена методом введено-найденоAdditional details
Additional titles
- Original title (Russian)
- Рентгенофлуоресцентный анализ ванадиевых катализаторов сернокислотного производства
Publishing Information
- Journal Title
- Zavodskaya Laboratoriya
- Journal Volume
- 73
- Journal Issue
- 8
- Journal Page Range
- p. 28-29
- ISSN
- 0321-4265
- CODEN
- ZVDLAU
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 39094907
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ACCURACY; CALCIUM COMPOUNDS; CATALYSTS; CESIUM COMPOUNDS; IRON COMPOUNDS; POTASSIUM COMPOUNDS; QUANTITATIVE CHEMICAL ANALYSIS; SILICON COMPOUNDS; SULFUR COMPOUNDS; VANADIUM COMPOUNDS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; ALKALINE EARTH METAL COMPOUNDS; CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; TRANSITION ELEMENT COMPOUNDS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 6 refs., 2 tabs.