Published 1987
| Version v1
Book
Electron microscopy in solid state physics
Creators
Description
This book reports on the capabilities and limitations of the application of electron microscopy to solid state physics and materials science. It is divided into two parts: 'Electron Microscopic Methods' and 'Applications in Solid State Physics'. In the first part the methods of electron microscope examination employed in solid state physics are described, with special reference to the reliable interpretation of electron micrographs (image formation, image interpretation). Without any claim to completeness, the second part of the book on the applications of electron microscopy comprises those fields of solid state physics and materials science to which it may appreciably contribute
Additional details
Publishing Information
- Publisher
- Elsevier.
- Imprint Place
- Amsterdam (Netherlands)
- ISBN
- 0-444-98967-6
- Imprint Pagination
- 596 p.
- Journal Volume
- 40
- Series
- Materials Science Monographs.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 19024726
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CRYSTAL DEFECTS; ELECTRON DIFFRACTION; FRACTOGRAPHY; FRACTURES; IMAGE PROCESSING; IMAGES; SCANNING ELECTRON MICROSCOPY; SOLID STATE PHYSICS; SURFACES
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON MICROSCOPY; FAILURES; MICROSCOPY; PHYSICS; SCATTERING
Optional Information
- Notes
- Revised translation of 'Elektronenmikroskopie in der Festkoerperphysik'; includes subject index.