Differential interferometry for measurement of density fluctuations and fluctuation-induced transport (invited)
- 1. University of California at Los Angeles, Los Angeles, California 90095 (United States)
Description
Differential interferometry employs two parallel laser beams with a small spatial offset (less than beam width) and frequency difference (1-2 MHz) using common optics and a single mixer for a heterodyne detection. The differential approach allows measurement of the electron density gradient, its fluctuations, as well as the equilibrium density distribution. This novel interferometry technique is immune to fringe skip errors and is particularly useful in harsh plasma environments. Accurate calibration of the beam spatial offset, accomplished by use of a rotating dielectric wedge, is required to enable broad application of this approach. Differential interferometry has been successfully used on the Madison Symmetric Torus reversed-field pinch plasma to directly measure fluctuation-induced transport along with equilibrium density profile evolution during pellet injection. In addition, by combining differential and conventional interferometry, both linear and nonlinear terms of the electron density fluctuation energy equation can be determined, thereby allowing quantitative investigation of the origin of the density fluctuations. The concept, calibration, and application of differential interferometry are presented.
Additional details
Identifiers
- DOI
- 10.1063/1.3464480;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 81
- Journal Issue
- 10
- Journal Page Range
- p. 10D509-10D509.7
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44019147
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM PROFILES; CALIBRATION; DENSITY; DETECTION; DIELECTRIC PROPERTIES; ELECTRON DENSITY; FLUCTUATIONS; INTERFEROMETRY; LASER RADIATION; MHZ RANGE; MIXERS; MST DEVICE; OPTICS; PELLET INJECTION; PHOTON BEAMS; PLASMA; REVERSE-FIELD PINCH
- Descriptors DEC
- BEAMS; CLOSED PLASMA DEVICES; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; EQUIPMENT; FREQUENCY RANGE; MATERIALS HANDLING EQUIPMENT; PHYSICAL PROPERTIES; PINCH DEVICES; PINCH EFFECT; RADIATIONS; REVERSED-FIELD PINCH DEVICES; THERMONUCLEAR DEVICES; TOROIDAL PINCH DEVICES; VARIATIONS
Optional Information
- Notes
- (c) 2010 American Institute of Physics