Published August 1, 2003 | Version v1
Journal article

Argon dilution effects on diamond deposition in electron cyclotron resonance plasma: a double probe study

Description

The Ar dilution effects on diamond deposition at moderate pressures (26.6-400 Pa) in an electron cyclotron resonance hydrogen-methane plasma have been studied in connection with electron temperature (Te) and electron density (ne). The double probe measurement revealed the dependence of Te and ne on Ar concentration, pressure, and microwave power. Te decreased in proportion to Ar concentration and was in the range of 3.7-7.5 eV. In contrast, ne exhibited only a small change with increasing Ar concentration except at a higher pressure and was on the order of 1010-1011 cm-3. The Ar dilution promoted nucleation rather than growth, as shown by an increase in nucleation density and renucleation on preexisting diamond grains. The mechanism leading to the peaked growth rate at 33-50 vol.% Ar was explained by the variation of the ion-bombardment energy and the fluxes of radicals, based on the measured Te and ne

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S0040609003006692;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
437
Journal Issue
1-2
Journal Page Range
p. 63-67
ISSN
0040-6090
CODEN
THSFAP

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37013442
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ARGON; DEPOSITION; DIAMONDS; DILUTION; ELECTRON CYCLOTRON-RESONANCE; ELECTRON DENSITY; ELECTRON TEMPERATURE; EV RANGE 01-10; HYDROGEN; IONS; METHANE; PLASMA; PROBES; RADICALS
Descriptors DEC
ALKANES; CARBON; CHARGED PARTICLES; CYCLOTRON RESONANCE; ELEMENTS; ENERGY RANGE; EV RANGE; FLUIDS; GASES; HYDROCARBONS; MINERALS; NONMETALS; ORGANIC COMPOUNDS; RARE GASES; RESONANCE

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.