Published May 27, 2009
| Version v1
Journal article
The phase equilibria in the Nd-Ti-Si ternary system at 773 K
- 1. Key Laboratory of Nonferrous Metal Materials and New Processing Technology, Ministry of Education, Guangxi University, Nanning, Guangxi 530004 (China)
- 2. State Key Laboratory of Powder Metallurgy, Central South University, Changsha, Hunan 410083 (China)
Description
The phase relations in the Nd-Ti-Si ternary system at 773 K have been investigated by X-ray powder diffraction (XRD), differential thermal analysis (DTA) and scanning electron microscopy (SEM) equipped with energy dispersive analysis (EDX). It consists of 14 single-phase regions, 25 two-phase regions and 12 three-phase regions. No ternary compounds were observed in this work. The phase equilibria confirm the existence of two binary compounds: Nd3Si4 (space group: Cmcm, a = 0.4360(1), b = 2.4605(6), c = 0.3925(1)) and NdSi1.6 (space group: Imma, a = 0.4138, b = 0.4111, c = 1.3731).
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2008.10.129Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2008.10.129;
- PII
- S0925-8388(08)01804-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 477
- Journal Issue
- 1-2
- Journal Page Range
- p. 274-277
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41042222
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DIFFERENTIAL THERMAL ANALYSIS; NEODYMIUM ALLOYS; ORTHORHOMBIC LATTICES; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; SILICON ALLOYS; SPACE GROUPS; TETRAGONAL LATTICES; TITANIUM ALLOYS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIAGRAMS; DIFFRACTION; ELECTRON MICROSCOPY; INFORMATION; MICROSCOPY; RARE EARTH ALLOYS; SCATTERING; SYMMETRY GROUPS; THERMAL ANALYSIS; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.