Published May 15, 2001
| Version v1
Journal article
Carbon vacancy-related defect in 4H and 6H SiC
Creators
- 1. Department of Physics and Measurement Technology, Linkoeping University, SE-581 83 Linkoeping (Sweden)
Description
An electron paramagnetic resonance (EPR) spectrum was observed at temperatures above 25 K in p-type 4H and 6H SiC irradiated with electrons. The center has C3V symmetry with an electron spin S=1/2. Using high frequency (∼95 GHz) EPR it was possible to obtain the detailed hyperfine structure due to the interaction with the four nearest silicon neighbors, and to identify the defect as the carbon vacancy in the positive-charge state (VC+). The g values and hyperfine tensor of the center in both polytypes are almost the same and no dependence on the inequivalent lattice sites has been detected
Additional details
Identifiers
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 63
- Journal Issue
- 20
- Journal Page Range
- p. 201201-201201.4
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35081461
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHARGE STATES; ELECTRON SPIN RESONANCE; HYPERFINE STRUCTURE; INTERACTIONS; SEMICONDUCTOR MATERIALS; SILICON CARBIDES; SPIN; TEMPERATURE RANGE 0013-0065 K; TENSORS; VACANCIES
- Descriptors DEC
- ANGULAR MOMENTUM; CARBIDES; CARBON COMPOUNDS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; MAGNETIC RESONANCE; MATERIALS; PARTICLE PROPERTIES; POINT DEFECTS; RESONANCE; SILICON COMPOUNDS; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2001 The American Physical Society