Published January 2004
| Version v1
Journal article
Growth of lanthanum oxide thin films by liquid injection MOCVD using a novel lanthanum alkoxide precursor
Creators
- 1. Department of Chemistry, University of Liverpool, Liverpool (United Kingdom)
- 2. Epichem Oxides and Nitrides, Power Road, Bromborough, Wirral, Merseyside (United Kingdom)
- 3. Department of Materials Science and Engineering, University of Liverpool (United Kingdom)
- 4. Institute of Surface Science and Technology, University of Loughborough (United Kingdom)
Description
Carbon-free lanthanum oxide is deposited by liquid injection MOCVD over a wide temperature range (300-600 C) in the presence of oxygen using a new volatile lanthanum alkoxide precursor [La(mmp)3]. SEM of a typical lanthanum oxide film deposited at 450 C from a [La(mmp)3]/tetraglyme mixture in toluene reveals a columnar growth structure with XRD reflection pattern and intensity approximately consistent with that of La2O3 powder. The paper suggests the suitability of this low temperature process for the deposition of high-κ lanthanum oxide films as gate dielectric for Si-based TFTs. (Abstract Copyright [2004], Wiley Periodicals, Inc.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/cvde.200304164Additional details
Identifiers
Publishing Information
- Journal Title
- Chemical Vapor Deposition
- Journal Volume
- 10
- Journal Issue
- 1
- Journal Page Range
- p. 13-17
- ISSN
- 0948-1907
- CODEN
- CVDEFX
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 35026699
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ARRHENIUS EQUATION; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH; LANTHANUM OXIDES; ORGANOMETALLIC COMPOUNDS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; EQUATIONS; FILMS; LANTHANUM COMPOUNDS; MICROSCOPY; ORGANIC COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SCATTERING; SURFACE COATING; TEMPERATURE RANGE
Optional Information
- Notes
- With 4 figs., 2 tabs., 28 refs.. SICI: 0948-1907(20040116)10:1<13::AID-CVDE200304164>3.0.TX;2-K