Published September 1, 2007
| Version v1
Journal article
Noise performance of the D0 layer 0 silicon detector
Description
A new inner detector called Layer 0 has been added to the existing silicon detector for the DZero colliding beams experiment [V.M. Abazoz et al., Nucl. Instr. and Meth. A 565 (2006) 463]. This detector has an all carbon fiber support structure that employs thin copper clad Kapton sheets embedded in the surface of the carbon fiber structure to improve the grounding of the structure and a readout system that fully isolates the local detector ground from the rest of the detector. Initial measurements show efficiencies greater than 90% and 0.3 ADC count (240 e) common mode contribution to the signal noise. The total detector capacitance is 24 pF so this corresponds to 2 μV of common mode voltage
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.05.281Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.05.281;
- PII
- S0168-9002(07)01168-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 579
- Journal Issue
- 2
- Journal Page Range
- p. 718-722
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 6. 'Hiroshima' symposium on the development and application of semiconductor detectors
- Dates
- 11-15 Sep 2006
- Place
- Carmel, CA (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39060972
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANALOG-TO-DIGITAL CONVERTERS; CAPACITANCE; CARBON FIBERS; COLLIDING BEAMS; COPPER; EFFICIENCY; LAYERS; NOISE; PERFORMANCE; READOUT SYSTEMS; SI SEMICONDUCTOR DETECTORS; SIGNALS; SILICON
- Descriptors DEC
- BEAMS; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FIBERS; MEASURING INSTRUMENTS; METALS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMIMETALS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.