Published June 2004 | Version v1
Journal article Metadata-only

Monte-Carlo calculations of HPGe detection efficiency and coincidence-summing correction

Creators

  • 1. China Center for Disease Control and Prevention, Beijing (China). National Inst. for Radiological Protection and Nuclear Safety

Description

Objective: This paper introduces a Monte-Carlo program Coo 12000 for calculating HPGe detection efficiency and coincidence-summing correction. It employs Monte Carlo emulation (MC) technique for calculating detection efficiency and coincidence-summing correction of HPGe gamma spectrometry system. Methods: The program is written in Fortran and tested with 3 types of volume calibration sources simulating air, water and soil samples, respectively, and each source contained 8 radionuclides. Results: The results proved that the relative differences of calculated and actually measured coincidence-summing corrections were within ±5.14%, ±12.1% and ±10.4%, respectively. Tests also made for point source at distances to detector of 5 cm, 10 cm and 25 cm, respectively. It indicated that the relative differences of measured and calculated efficiencies were within ±10.6%, ±5.6% and ±3.04%, respectively. Conclusion: The reported MC program Coo 12000 is applicable to environmental radiation monitoring for calculating HPGe detection efficiency and coincidence-summing correction

Additional details

Publishing Information

Journal Title
Chinese Journal of Radiological Health
Journal Volume
13
Journal Issue
2
Journal Page Range
p. 92-94
ISSN
1004-714X

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
36029100
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
C CODES; COINCIDENCE METHODS; COMPARATIVE EVALUATIONS; CORRECTIONS; EFFICIENCY; EXPERIMENTAL DATA; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; RADIATION MONITORING; THEORETICAL DATA
Descriptors DEC
CALCULATION METHODS; COMPUTER CODES; COUNTING TECHNIQUES; DATA; EVALUATION; GE SEMICONDUCTOR DETECTORS; INFORMATION; MEASURING INSTRUMENTS; MONITORING; NUMERICAL DATA; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS