Published May 5, 2003
| Version v1
Journal article
Velocity distribution of ions incident on a wafer in two frequency capacitively-coupled plasma
Creators
- 1. Institute of Fluid Science, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, 980-8577 (Japan)
Description
The dynamic structure of two-frequency capacitively-coupled plasmas (2f-CCP) were examined using the self-consistent Particle-in-Cell/Monte Carlo (PIC/MC) simulation. At first the dependence of the discharge structure on wafer biasing conditions were investigated using one-dimensional (1D) computation. The results show that the plasma potential oscillates with both frequencies. The amplitude of the high frequency oscillation is modulated by the instantaneous potential of the low frequency biasing electrode. Furthermore, the axisymmetrical two-dimensional (2D) PIC/MC simulation was performed to investigate the influence of a geometric configuration of the reactor on the plasma structure
Additional details
Identifiers
- DOI
- 10.1063/1.1581659;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 663
- Journal Issue
- 1
- Journal Page Range
- p. 1079-1086
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 23. international symposium on rarefied gas dynamics
- Dates
- 20-25 Jul 2002
- Place
- Whistler, BC (Canada)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35067912
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMPLITUDES; AXIAL SYMMETRY; ELECTRODES; HIGH-FREQUENCY DISCHARGES; MONTE CARLO METHOD; OSCILLATIONS; PLASMA; PLASMA POTENTIAL; PLASMA SIMULATION; VELOCITY
- Descriptors DEC
- CALCULATION METHODS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; SIMULATION; SYMMETRY
Optional Information
- Notes
- (c) 2003 American Institute of Physics