Published May 5, 2003 | Version v1
Journal article

Velocity distribution of ions incident on a wafer in two frequency capacitively-coupled plasma

  • 1. Institute of Fluid Science, Tohoku University, Katahira 2-1-1, Aoba-ku, Sendai, 980-8577 (Japan)

Description

The dynamic structure of two-frequency capacitively-coupled plasmas (2f-CCP) were examined using the self-consistent Particle-in-Cell/Monte Carlo (PIC/MC) simulation. At first the dependence of the discharge structure on wafer biasing conditions were investigated using one-dimensional (1D) computation. The results show that the plasma potential oscillates with both frequencies. The amplitude of the high frequency oscillation is modulated by the instantaneous potential of the low frequency biasing electrode. Furthermore, the axisymmetrical two-dimensional (2D) PIC/MC simulation was performed to investigate the influence of a geometric configuration of the reactor on the plasma structure

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
663
Journal Issue
1
Journal Page Range
p. 1079-1086
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
23. international symposium on rarefied gas dynamics
Dates
20-25 Jul 2002
Place
Whistler, BC (Canada)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35067912
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMPLITUDES; AXIAL SYMMETRY; ELECTRODES; HIGH-FREQUENCY DISCHARGES; MONTE CARLO METHOD; OSCILLATIONS; PLASMA; PLASMA POTENTIAL; PLASMA SIMULATION; VELOCITY
Descriptors DEC
CALCULATION METHODS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; SIMULATION; SYMMETRY

Optional Information

Notes
(c) 2003 American Institute of Physics