Published August 2022
| Version v1
Journal article
Industries highest performing 3D X-ray automatic inspection system
- 1. Omron Corporation, Industrial Automation Company, Kyoto (Japan)
Description
In every industry, there is a growing need for the automation of product inspections at production sites. In particular, there are many quality problems with electronic substrates, and inspection technology that reliably detects defective substrates is desirable. This paper introduces the technology of the CT-type in-line automatic X-ray inspection system (VT-750 series) based on the OMRON AXI (Automated X-ray Inspection system), and also introduces the features of a new product (VT-750-V3) that has succeeded in further speeding-up. (A.O.)
Abstract (Japanese)
本稿では、基板実装の世界で、X線検査装置における重要課題であったインライン全面検査を実現するため、従来機種から1.5倍の高速検査を実現したオムロンの3D X線検査装置VT-X750-V3を紹介する。(著者)Additional details
Additional titles
- Original title (Japanese)
- 世界最速3D X線検査装置の紹介.VT-X750-V3
Publishing Information
- Journal Title
- Kensa Gijutsu
- Journal Volume
- 27
- Journal Issue
- 8
- Series
- 雑誌名:検査技術
- Journal Page Range
- p. 49-57
- ISSN
- 1342-9825
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 54040499
- Subject category
- S42: ENGINEERING;
- Descriptors DEI
- ALGORITHMS; CAT SCANNING; CMOS CIRCUITS; CROSS SECTIONS; DISPLAY DEVICES; DYNAMICAL SYSTEMS; LOW DOSE IRRADIATION; THREE-DIMENSIONAL CALCULATIONS; X-RAY DETECTION; X-RAY SOURCES
- Descriptors DEC
- COMPUTER OUTPUT DEVICES; COMPUTER-GRAPHICS DEVICES; COMPUTERIZED TOMOGRAPHY; DETECTION; DIAGNOSTIC TECHNIQUES; ELECTRONIC CIRCUITS; INTEGRATED CIRCUITS; IRRADIATION; MATHEMATICAL LOGIC; MICROELECTRONIC CIRCUITS; RADIATION DETECTION; RADIATION SOURCES; TOMOGRAPHY
Optional Information
- Notes
- 4 refs., 10 figs.