Published 1977
| Version v1
Miscellaneous
Charged particle activation analysis
Description
The techniques of prompt and delayed activation analysis are outlined. Methods using cyclotron beams are suitable for delayed A.A., but prompt methods with relatively low energy beams serve a useful purpose for analysis of thin layers and surfaces. Multi-element analyses with prompt X-rays, generally applicable analysis by backscattering and specific analyses by nuclaer reactions are described
Abstract (Afrikaans)
Die beginsels van pront en vertraagde-aktiwerings analise is beskrywe. Metode wat van siklotronbundels gebruik maak kan toegepas word vir vertraagde A.A., maar pront metodes met gelaaide deeltjies van relatiewe lae energiee kan dien vir die ontleding van dun lagies en oppervlakke. Multi-element ontledings met pront X-strale, algemeen-toepasbare analise deur terugverstroiing en hoogs spesifieke analise deur kernreaksies is beskryweAdditional details
Publishing Information
- Imprint Title
- School on chemistry in nuclear technology, Johannesburg, 24-26 October 1977
- Imprint Pagination
- p. 229-258.
- Report number
- INIS-mf--4203
Conference
- Title
- School on chemistry in nuclear technology.
- Dates
- 24 - 26 Oct 1977.
- Place
- Johannesburg, South Africa.
INIS
- Country of Publication
- South Africa
- Country of Input or Organization
- South Africa
- INIS RN
- 9375324
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACTIVATION ANALYSIS; BACKSCATTERING; CHARGED PARTICLES; CROSS SECTIONS; CYCLOTRONS; HALF-LIFE; IRRADIATION; PROMPT GAMMA RADIATION; PROMPT PROTONS; RUTHERFORD SCATTERING; TARGETS
- Descriptors DEC
- ACCELERATORS; BARYONS; CATIONS; CHEMICAL ANALYSIS; CYCLIC ACCELERATORS; ELASTIC SCATTERING; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; GAMMA RADIATION; HADRONS; HYDROGEN IONS; HYDROGEN IONS 1 PLUS; IONIZING RADIATIONS; IONS; NUCLEONS; PROTONS; RADIATIONS; SCATTERING