Optimization of MBE of CdTe/CdTe

A detailed optimization of MBE growth of CdTe on CdTe (111)B using white beam synchrotron x-ray topography, and x-ray rocking curve analysis has been carried out. Defect structures in (111)B substrates and epilayers are imaged with white beam topography and, for the first time, direct observation of stress induced microtwin growth in CdTe epilayers has been made. X-ray rocking curve analysis of CdTe substrates is shown to be relatively insensitive to defect structures consisting of dislocations and inclusions. On the other hand rocking curve analysis of (111) epilayers reveals a sensitivity to the presence of microtwin. In this paper the defect microstructure of a CdTe (111)B epilayer with the narrowest rocking curve FWHM value published to date (9.4 arc-sec) is discussed