Published July 21, 2001 | Version v1
Journal article Metadata-only

Scanning soft X-ray spectromicroscopy at the Pohang Light Source: commissioning results

Creators

Description

A scanning spectromicroscopy facility has been installed at the undulator radiation beamline at the Pohang Light Source. The spectromicroscopy is operational in both the scanning transmission X-ray microscopy (STXM) and the scanning photoelectron microscopy (SPEM) modes. Currently, the measured X-ray spot size on the sample is about 0.4 μm. The effective photon energy range of the STXM is 250-1000 eV and that of the SPEM is 400-1000 eV. The performance of the facility is presented in this report

Additional details

Identifiers

PII
S0168900201005174;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
467-468
Journal Issue
1
Journal Page Range
p. 909-912
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
Germany
INIS RN
34013922
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
BEAM PROFILES; EV RANGE 100-1000; ONDULATOR RADIATION; PHOTOELECTRIC EMISSION; PHOTON BEAMS; SCANNING ELECTRON MICROSCOPY; SOFT X RADIATION; SYNCHROTRON RADIATION SOURCES; X-RAY SPECTROSCOPY
Descriptors DEC
BEAMS; BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRON EMISSION; ELECTRON MICROSCOPY; EMISSION; ENERGY RANGE; EV RANGE; IONIZING RADIATIONS; MICROSCOPY; PHOTOELECTRIC EFFECT; RADIATION SOURCES; RADIATIONS; SPECTROSCOPY; X RADIATION

Optional Information

Copyright
Copyright (c) 2001 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.