Published September 2007
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X-ray scattering by 2H-NbSe2 in CDW-regime
Creators
- 1. Inst. for low temperature physics and engineering, Kharkov (Ukraine)
Description
Full text: Here we present X-ray scattering measurements in commercial diffractometer with the original continuous-flow cryostat were performed in the temperature range 10-300 K at CuK alpha in the 1eV energy window which reveal new system of peaks on diffraction patterns below transition to the charge density wave state (TCDW = 32.5 K). They are characterized by complicated hierarchy, time and temperature dependence. The most fascinating feature is anomalously high intensity with drastic disappearance during heating immediately at TCDW. Comparison with a high-resolution neutron diffraction measurements is discussed. (authors)
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Additional details
Publishing Information
- Publisher
- Khorezm Mamun academy of sciences
- Imprint Place
- Khiva (Uzbekistan)
- Imprint Title
- Abstracts of fifth international conference 'Magnetic and superconducting materials'
- Imprint Pagination
- 114 p.
- Journal Page Range
- p. 61
- Report number
- INIS-UZ--150
Conference
- Title
- 5. international conference on Magnetic and superconducting materials
- Dates
- 25-30 Sep 2007
- Place
- Khiva (Uzbekistan)
INIS
- Country of Publication
- Uzbekistan
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 39121363
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYOSTATS; ION DENSITY; NEUTRON DIFFRACTION; SCATTERING; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0013-0065 K; TEMPERATURE RANGE 0065-0273 K; TIME DEPENDENCE; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- COHERENT SCATTERING; CONTROL EQUIPMENT; DIFFRACTION; DIFFRACTOMETERS; EQUIPMENT; MEASURING INSTRUMENTS; SCATTERING; TEMPERATURE RANGE; THERMOSTATS