Published May 2, 2010 | Version v1
Journal article

Atomic resolution mapping of the excited-state electronic structure of Cu2O with time-resolved x-ray absorption spectroscopy

Description

We have used time-resolved soft x-ray spectroscopy to investigate the electronic structure of optically excited cuprous oxide at the O K-edge and the Cu L3-edge. The 400 nm optical excitation shifts the Cu and O absorptions to lower energy, but does not change the integrated x-ray absorption significantly for either edge. The constant integrated x-ray absorption cross-section indicates that the conduction-band and valence-band edges have very similar Cu 3d and O 2p orbital contributions. The 2.1 eV optical band gap of Cu2O significantly exceeds the one eV shift in the Cu L3- and O K-edges absorption edges induced by optical excitation, demonstrating the importance of core-hole excitonic effects and valence electron screening in the x-ray absorption process.

Availability note (English)

Available from OSTI as DE00983225; PURL: https://www.osti.gov/servlets/purl/983225-HM4hon/

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter and Materials Physics
Journal Volume
80
Journal Page Range
p. 5
ISSN
1098-0121

Optional Information

Contract/Grant/Project number
AC02-05CH11231
Notes
Journal Publication Date: 15 September 2009
Funding organization
Chemical Sciences Division (United States)
Secondary number(s)
LBNL--3354E