Published October 27, 2008
| Version v1
Journal article
Tenfold improved sensitivity using high refractive-index substrates for surface plasmon sensing
- 1. Department of Electronic Science, Graduate School of Engineering, Kyoto University, Nishigyo-ku, Katsura, 615-8510 Kyoto (Japan)
- 2. Nanoscience and Technology, International Graduate School of Art and Sciences, Yokohama City University, Seto, Kanazawa-ku, Yokohama 236-0027 (Japan)
- 3. Teramecs Ltd., 97 Higashi Koyanouchi-cho, Takeda, Fushimi-ku, 612-8448 Kyoto (Japan)
- 4. Murata Manufactoring Co., Ltd., Higashikotari 1-chome, Nagaokakyo-shi, 617-8555 Kyoto (Japan)
Description
Surface plasmon resonance sensors exploit the high sensitivity to local perturbations of plasma waves in a thin metal layer. These devices have a wide range of applications as biomedical, environmental, industrial, and homeland security. We concentrate on the theoretical aspects of the sensing principle. By calculations at various indexes of refraction we proved that using substrate material of higher index, sensitivity and dynamics range improve conspicuously. Finally, we show experimental data taken using a special transparent ceramic material of exceptionally high index of refraction n=2.04. Tests demonstrate sensitivity about one order of magnitude better than those obtained with conventional BK7 glass
Additional details
Identifiers
- DOI
- 10.1063/1.3005584;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 93
- Journal Issue
- 17
- Journal Page Range
- p. 174104-174104.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40051076
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- CERAMICS; DISTURBANCES; LAYERS; METALS; PLASMA WAVES; REFRACTIVE INDEX; SECURITY; SENSITIVITY; SENSORS; SUBSTRATES
- Descriptors DEC
- ELEMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES
Optional Information
- Notes
- (c) 2008 American Institute of Physics