Published 1997 | Version v1
Miscellaneous

Production of Sinner layer of Si-Tracker 1996 DELPHI 96-38 MVX 12

  • 1. Universidade Federal, Rio de Janeiro, RJ (Brazil). Inst. de Fisica
  • 2. Istituto Nazionale di Fisica Nucleare, Padova (Italy)
  • 3. Padova Univ. (Italy). Dipt. di Fisica

Description

The DELPHI silicon microvertex detector is being upgraded for 1996. To improve the forward coverage there will be two layers of pixel detectors and two lanes of mini strips detectors on each side of it. In the barrel region the Outer and Inner layers will have their lengths increased and the Closer, which was already a longer layer, will remain unchanged. To avoid confusion with the old detector, the layers of the new Si-tracker are called Scloser, Souter and Sinner. The aim of this note is to fully describe the process of production of Sinner modules. In the second section the layer itself is described, the third gives an overview of the assembly and the fourth explains the test procedures. Finally, the fifth section makes a summary of the results obtained. (author)

Part of:
Proceedings of the 17. Brazilian national meeting on particles and fields

Additional details

Publishing Information

Imprint Title
Proceedings of the 17. Brazilian national meeting on particles and fields
Imprint Pagination
671 p.
Journal Page Range
p. 277-283

Conference

Title
17. Brazilian national meeting on particles and fields
Dates
2-6 Sep 1996
Place
Serra Negra, SP (Brazil)

Optional Information

Notes
4 refs., 8 figs.