Published May 15, 2000 | Version v1
Journal article

Nanofabrication of custom X-ray optical components

  • 1. Laboratory for Micro- and Nanotechnology, Paul Scherrer Institute, CH 5232 Villigen-PSI (Switzerland)
  • 2. European Synchrotron Radiation Facility, B. P. 220, F-38043 Grenoble Cedex (France)

Description

A variety of nanostructuring processes have been developed at the Paul Scherrer Institute (PSI) in order to provide optical instrumentation for beamline experiments. We present methods for the fabrication of custom elements such as sub-micron high aspect ratio tantalum slits and pinholes, a calcium fluoride test object for element mapping experiments at the Ca-K-edge, and transmission zone plates with germanium structures for the multi-keV region. Furthermore, we report on the generation of linear silicon Bragg-Fresnel Lenses (BFLs) with unprecedented dimensions. Lenses with 100 nm outermost zone width, lengths up to 10 mm and widths up to 1 mm were tested at the optics beam line of the ESRF. We measured a diffraction efficiency of 26% at a beam energy of 13.25 keV. The purpose of this contribution to the conference is to demonstrate the flexibility of the micro- and nanostructuring facilities at PSI and to encourage scientific groups at synchrotron beam lines to join future collaborations

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
507
Journal Issue
1
Journal Page Range
p. 704-707
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
6. international conference on X-ray microscopy
Dates
2-6 Aug 1999
Place
Berkeley, CA (United States)

Optional Information

Notes
(c) 2000 American Institute of Physics.