Published August 1, 2013
| Version v1
Journal article
Functional test of a Radon sensor based on a high-resistivity-silicon BJT detector
Creators
- 1. RSens srl, Modena (Italy)
- 2. DISI, Università di Trento, and INFN Trento, Trento (Italy)
- 3. Dipartimento di Fisica, Università di Pisa, and INFN Pisa, Pisa (Italy)
- 4. Scuola Normale Superiore and INFN Pisa, Pisa (Italy)
- 5. Dipartimento di Ingegneria Meccanica, Nucleare e della Produzione, Università di Pisa, Pisa (Italy)
- 6. En and tech, Università di Modena e Reggio Emilia, Reggio Emilia (Italy)
Description
A battery-powered, wireless Radon sensor has been designed and realized using a BJT, fabricated on a high-resistivity-silicon substrate, as a radiation detector. Radon daughters are electrostatically collected on the detector surface. Thanks to the BJT internal amplification, real-time α particle detection is possible using simple readout electronics, which records the particle arrival time and charge. Functional tests at known Radon concentrations, demonstrated a sensitivity up to 4.9 cph/(100 Bq/m3) and a count rate of 0.05 cph at nominally-zero Radon concentration
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2012.10.097Additional details
Identifiers
- DOI
- 10.1016/j.nima.2012.10.097;
- PII
- S0168-9002(12)01268-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 718
- Journal Page Range
- p. 302-304
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 12. Pisa meeting on advanced detectors
- Dates
- 20-26 May 2012
- Place
- La Biodola, Elba (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45047882
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA DETECTION; AMPLIFICATION; CONCENTRATION RATIO; COUNTING RATES; DESIGN; READOUT SYSTEMS; SENSITIVITY; SENSORS; SI SEMICONDUCTOR DETECTORS; SILICON; SURFACES; TRANSISTORS
- Descriptors DEC
- CHARGED PARTICLE DETECTION; DETECTION; DIMENSIONLESS NUMBERS; ELEMENTS; MEASURING INSTRUMENTS; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMIMETALS
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.