Dielectric response of irradiated PADC polymer track detector
Creators
- 1. Department of Physics, Gauhati University, Guwahati 781014 (India)
- 2. Nuclear Science Centre, New Delhi 110067 (India)
Description
The dielectric properties of pristine and irradiated poly allyl diglycol carbonate (PADC) were studied both at room temperature and at liquid nitrogen temperatures. The samples were irradiated with O5+ (50 MeV) and Si8+ (100 MeV) in the fluence range 1010 cm-2 to 5 x 1012 cm-2 in case of oxygen and 1010 cm-2 to 1012 cm-2 in case of silicon. The frequency (f) dependence of the dielectric constant was studied. In pristine and Si8+ irradiated samples the dielectric constant (ε') decreases at liquid nitrogen temperatures while in O5+ irradiated samples the dielectric constant has been found to increase slightly. The results so obtained were explained on the basis of the 'universal law' of dielectric response ε' ∝ f n-1 and dielectric loss ε' ∝ f n'-1
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.02.022;
- PII
- S0168-583X(05)00218-1;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 234
- Journal Issue
- 4
- Journal Page Range
- p. 520-524
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37017040
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CARBONATES; DIELECTRIC MATERIALS; DIELECTRIC TRACK DETECTORS; IRRADIATION; LIQUIDS; MEV RANGE 10-100; NITROGEN; OXYGEN; PARTICLE TRACKS; PERMITTIVITY; POLYMERS; SILICON; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- CARBON COMPOUNDS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY RANGE; FLUIDS; MATERIALS; MEASURING INSTRUMENTS; MEV RANGE; NONMETALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION DETECTORS; SEMIMETALS; TEMPERATURE RANGE
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.