Published July 2010 | Version v1
Journal article

Simulation of radioactive decay in GEANT Monte Carlo codes: Comparison between spectra and efficiencies computed with sch2for and G4RadioactiveDecay

  • 1. ENEA Istituto Nazionale di Metrologia delle Radiazioni Ionizzanti (INMRI), Centro Ricerche Casaccia, I-00123 Rome (Italy)
  • 2. Physics Department, Alma Mater Studiorum, University of Bologna, Viale B. Pichat 6/2, I-40127 Bologna (Italy)

Description

Two CERN Monte Carlo codes, i.e. GEANT3.21 and GEANT4, were compared. The specific routine (sch2for), implemented in GEANT3.21 to simulate a disintegration process, and the G4RadioactiveDecay class, provided by GEANT4, were used for the computation of the full-energy-peak and total efficiencies of several radionuclides. No reference to experimental data was involved. A level of agreement better than 1% for the total efficiency and a deviation lower than 3.5% for the full-energy-peak efficiencies were found.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apradiso.2009.12.024

Additional details

Identifiers

DOI
10.1016/j.apradiso.2009.12.024;
PII
S0969-8043(09)00807-0;

Publishing Information

Journal Title
Applied Radiation and Isotopes
Journal Volume
68
Journal Issue
7-8
Journal Page Range
p. 1428-1432
ISSN
0969-8043
CODEN
ARISEF

Conference

Title
17. international conference on radionuclide metrology and its applications
Acronym
ICRM 2009
Dates
7-11 Sep 2009
Place
Bratislava (Slovakia)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42012674
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CERN; COMPARATIVE EVALUATIONS; COMPUTERIZED SIMULATION; EFFICIENCY; HIGH-PURITY GE DETECTORS; MONTE CARLO METHOD; NUCLEAR DECAY; RADIOISOTOPES; SPECTRA
Descriptors DEC
CALCULATION METHODS; DECAY; EVALUATION; GE SEMICONDUCTOR DETECTORS; INTERNATIONAL ORGANIZATIONS; ISOTOPES; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SIMULATION

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.