Micro-PIXE analysis of a single crystal of Y1Ba2Cu3O7-δ superconductor

A single crystal sample of Y1Ba2Cu3O7-δ superconductor was analyzed using a scanning proton microbeam and the PIXE technique. Micrographs of the crystal surface obtained by SEM revealed a small secondary crystal overgrowth on the main crystal. Micro-PIXE measurements of elemental composition and distribution profiles were carried out on the main base crystal, the smaller crystal overgrowth and in the interface region between them. In addition to Y, Ba and Cu, Au and traces of Cr and Fe were also detected in all three areas. Distributions of Y, Ba, Cu and Au were found to be uniform over both the main crystal and its overgrowth. However, the interface region exhibited strong anomalies in the distribution patterns of these elements. (orig.)