Published February 22, 2006 | Version v1
Journal article

Crystal size and shape analysis of Pt nanoparticles in two and three dimensions

  • 1. Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ (United Kingdom)
  • 2. Johnson Matthey Technology Center, Blount's Court, Sonning Common, Reading RG4 9NH (United Kingdom)

Description

The majority of industrial catalysts are high-surface-area solids, onto which an active component is dispersed in the form of nanoparticles that have sizes of between 1 and 20 nm. In an industrial environment, the crystal size distributions of such particles are conventionally measured by using either bright-field transmission electron microscope (TEM) images or X-ray diffraction. However, the analysis of particle sizes and shapes from two-dimensional bright-field TEM images is affected by variations in image contrast between adjacent particles, by the difficulty of distinguishing the particles from their matrix, and by overlap between particles when they are imaged in projection. High-angle annular dark-field (HAADF) electron tomography provides a convenient technique for overcoming many of these problems, by allowing the three-dimensional shapes and sizes of high atomic number nanoparticles that are supported on a low atomic number support to be recorded. Here, we discuss the three-dimensional analysis of particle sizes and shapes from such tomographic data, and we assess whether such measurements provide different information from that obtained using two-dimensional TEM images and X-ray diffraction measurements

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/26/367/jpconf6_26_089.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
26
Journal Issue
1
Journal Page Range
p. 367-370
ISSN
1742-6596

Conference

Title
Conference on imaging, analysis and fabrication on the nanoscale
Acronym
EMAG-NANO 2005
Dates
31 Aug - 2 Sep 2005
Place
Leeds (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37056123
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CATALYSTS; CRYSTALS; DISTRIBUTION; IMAGES; NANOSTRUCTURES; PARTICLE SIZE; PARTICLES; PLATINUM; SOLIDS; SURFACE AREA; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; VARIATIONS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; PLATINUM METALS; SCATTERING; SIZE; SURFACE PROPERTIES; TRANSITION ELEMENTS