Published February 2005 | Version v1
Journal article

A simple electron-beam lithography system

  • 1. Department of Micro and Nanotechnology, Technical University of Denmark, Bldg. 345e, Lyngby 2800 (Denmark)

Description

A large number of applications of electron-beam lithography (EBL) systems in nanotechnology have been demonstrated in recent years. In this paper we present a simple and general-purpose EBL system constructed by insertion of an electrostatic deflector plate system at the electron-beam exit of the column of a scanning electron microscope (SEM). The system can easily be mounted on most standard SEM systems. The tested setup allows an area of up to about 50x50 μm to be scanned, if the upper limit for acceptable reduction of the SEM resolution is set to 10 nm. We demonstrate how the EBL system can be used to write three-dimensional nanostructures by electron-beam deposition

Additional details

Identifiers

DOI
10.1016/j.ultramic.2004.09.011;
PII
S0304-3991(04)00184-6;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
102
Journal Issue
3
Journal Page Range
p. 215-219
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036565
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
DEPOSITION; ELECTRON BEAMS; ELECTRONS; FABRICATION; NANOSTRUCTURES; OPTICS; PLATES; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION
Descriptors DEC
BEAMS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; PARTICLE BEAMS; RESOLUTION

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.