Published February 2005
| Version v1
Journal article
A simple electron-beam lithography system
- 1. Department of Micro and Nanotechnology, Technical University of Denmark, Bldg. 345e, Lyngby 2800 (Denmark)
Description
A large number of applications of electron-beam lithography (EBL) systems in nanotechnology have been demonstrated in recent years. In this paper we present a simple and general-purpose EBL system constructed by insertion of an electrostatic deflector plate system at the electron-beam exit of the column of a scanning electron microscope (SEM). The system can easily be mounted on most standard SEM systems. The tested setup allows an area of up to about 50x50 μm to be scanned, if the upper limit for acceptable reduction of the SEM resolution is set to 10 nm. We demonstrate how the EBL system can be used to write three-dimensional nanostructures by electron-beam deposition
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2004.09.011;
- PII
- S0304-3991(04)00184-6;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 102
- Journal Issue
- 3
- Journal Page Range
- p. 215-219
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37036565
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DEPOSITION; ELECTRON BEAMS; ELECTRONS; FABRICATION; NANOSTRUCTURES; OPTICS; PLATES; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION
- Descriptors DEC
- BEAMS; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; PARTICLE BEAMS; RESOLUTION
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.