Published March 2013 | Version v1
Journal article

Characterisation of Cr, Si and P distribution at dislocations and grain-boundaries in neutron irradiated Fe–Cr model alloys of low purity

  • 1. Groupe de Physique des Matériaux, Université et INSA de Rouen, UMR 6634 CNRS, Avenue de l'Université, BP 12, 76801 Saint Etienne du Rouvray (France)

Description

Segregations at some dislocations and grain boundaries in Fe–5%Cr, Fe–9%Cr and Fe–12%Cr model alloys of low purity after neutron irradiation at 300 °C up to 0.6 dpa have been analyzed with atom probe tomography. All dislocation lines and low- and high-angle grain boundaries (GBs) which have been observed were enriched with Cr, Si and P. The segregations reveal the different dislocation structures associated to different type of analysed GBs. Cr and Si atoms were found to be nonhomogenously distributed around the dislocation cores because of the non isotropic stress field induced by edge dislocation lines. Concerning GBs, precipitate free zones (PFZs) are exhibited around the planar defects which were analysed in Fe–9%Cr and Fe–12%Cr model alloys. These PFZ are size dependant with the nominal level of Cr

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2012.11.027

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2012.11.027;
PII
S0022-3115(12)00613-7;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
434
Journal Issue
1-3
Journal Page Range
p. 49-55
ISSN
0022-3115
CODEN
JNUMAM

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45067246
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALLOYS; EDGE DISLOCATIONS; GRAIN BOUNDARIES; IMPURITIES; IRRADIATION; NEUTRONS; STRESSES
Descriptors DEC
BARYONS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DISLOCATIONS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; LINE DEFECTS; MICROSTRUCTURE; NUCLEONS

Optional Information

Copyright
Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.