Theory analysis and simulation of thickness series for reference samples used in calibration of X-ray instantaneous profile gauge for steel strip

In order to measure thickness accurately, it's important for the X-ray thickness measurement equipment to be demarcated using some reference samples. The more reference samples are taken, the more accurate the calibration curve is; but the system cost will be higher in the same time. Based on the profile gauge for steel strip, X-ray spectrum was generated using the TASMIP method. By analyzing the attenuation principle of the spectrum in the strip, the series of the reference samples was calculated. The thickness series, which could be used in practice was given. (authors)